The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 11, 2004

Filed:

Jul. 11, 2002
Applicant:
Inventors:

David J. Griffiths, South Sutton, NH (US);

Jonathan D. Scheuch, New London, NH (US);

Sean David Griffin, Henniker, NH (US);

Ronald A. Murray, Mont Vernon, NH (US);

Kelly A. Edgar, Sunapee, NH (US);

Assignee:

Labsphere, Inc., North Sutton, NH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/04 ;
U.S. Cl.
CPC ...
G01J 1/04 ;
Abstract

A prober for measuring the light output of digital devices integrally formed on a single wafer. The prober includes a light-integrating sphere sequentially aligned with selected devices. Each time that a device is aligned with the sphere, the device aligned with the sphere is activated, so that the light output of each device is individually measured. In the disclosed embodiment, the devices are vertical cavity surface emitting lasers (VCSELs) and light emitting diodes (LEDs).


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