Hillsboro, OR, United States of America

Scott T Peiffer

This inventor holds 1 USPTO granted patent. Top assignee: Intel Corporation. Active years: 2009.


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 2009

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Scott T Peiffer: Innovator in Fault Tolerant Storage Systems

Introduction

Scott T Peiffer is a notable inventor based in Hillsboro, OR (US). He has made significant contributions to the field of storage subsystems, particularly in the area of fault tolerance. His innovative approach to detecting soft errors has the potential to enhance the reliability of data storage systems.

Latest Patents

Scott T Peiffer holds a patent for a method and apparatus titled "Fault tolerant soft error detection for storage subsystems." This invention provides a mechanism for detecting soft errors in a storage subsystem. The method involves concurrently generating data for a write operation in a first controller while simultaneously generating it in a second controller. The first controller writes this data to a storage device, and soft errors are detected by comparing the two sets of write data through respective checksums or by reading back the write data from the storage device using the second controller.

Career Highlights

Scott is currently employed at Intel Corporation, where he continues to work on innovative technologies that improve data storage solutions. His expertise in fault tolerance and error detection has positioned him as a valuable asset in the tech industry.

Collaborations

Scott has collaborated with talented individuals such as Matthew B Tangvald and Morgan J Dempsey. Their combined efforts contribute to the advancement of technology in storage systems.

Conclusion

Scott T Peiffer's work in fault tolerant storage systems exemplifies the importance of innovation in technology. His contributions are paving the way for more reliable data storage solutions in the future.

Profile summary based on public USPTO records.
Please report any incorrect information to [email protected]
Loading…