This inventor holds 1 USPTO granted patent. Top assignee: Lsi Corporation. Active years: 2009.
Company Filing History:
Years Active: 2009
Title: Scott Avery Beeker: Innovator in Integrated Circuit Testing
Introduction
Scott Avery Beeker is a notable inventor based in Coppell, TX (US). He has made significant contributions to the field of integrated circuit testing, particularly through his innovative patent. His work focuses on enhancing the testing processes for embedded hard macros within system on a chip (SoC) designs.
Latest Patents
Scott Beeker holds a patent for a "Test wrapper including integrated scan chain for testing embedded hard macro in an integrated circuit chip." This invention provides an apparatus and method for testing a hard macro embedded in an SoC. The test wrapper, which is integrated into the SoC, includes a scan chain that surrounds the inputs and outputs of the hard macro. It allows for the reception of known test data patterns during testing, while also accommodating standard inputs when not in test mode. This dual functionality enables effective testing of the hard macro, even when its logic design and operation are unknown.
Career Highlights
Scott Beeker is currently employed at LSI Corporation, where he continues to apply his expertise in integrated circuit technology. His work at LSI Corporation has allowed him to contribute to advancements in the semiconductor industry. He has been recognized for his innovative approach to solving complex testing challenges in integrated circuits.
Collaborations
Throughout his career, Scott has collaborated with talented professionals, including Mark Allen Boike and Seshagiri Prasad Kalluri. These collaborations have fostered a creative environment that encourages innovation and the development of cutting-edge technologies.
Conclusion
Scott Avery Beeker is a distinguished inventor whose work in integrated circuit testing has made a significant impact on the industry. His innovative patent demonstrates his commitment to advancing technology and improving testing methodologies. His contributions continue to influence the field of semiconductor design and testing.