Rolla, MO, United States of America

Satyajeet Shinde


Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Innovations by Satyajeet Shinde: Pioneer in Microwave Reflectometry

Introduction: Satyajeet Shinde, based in Rolla, MO, is an inventive mind recognized for his innovative contributions to microwave reflectometry. He has made significant strides in utilizing microwave reflections to assess the integrity of devices, focusing on distinguishing between authentic and counterfeit products as well as aging devices. His work presents a novel approach in the realm of physical inspections.

Latest Patents: Satyajeet holds a patent for "Microwave reflectometry for physical inspections." This patent leverages microwaves' reflective properties to create unique electromagnetic signatures for each device. The method involves comparing the electromagnetic signature of a reference device against that of the tested device. Such comparisons facilitate the evaluation of the acceptability and authenticity of the device under examination, enhancing quality control processes in various applications.

Career Highlights: Satyajeet works with The Curators of the University of Missouri, a reputable institution dedicated to research and innovation. Through his role, he contributes to the technological advancements that impact various fields, particularly in ensuring the reliability and safety of devices through advanced testing methods.

Collaborations: Throughout his career, Satyajeet has collaborated with esteemed colleagues, including Mohammad Tayeb Ghasr and Reza Zoughi. Their collective expertise fosters a dynamic environment of innovation and research, allowing for the continuous development and refinement of microwave reflectometry techniques.

Conclusion: Satyajeet Shinde's contributions to microwave reflectometry signify a noteworthy advancement in the field of physical inspections. His patented innovation not only supports quality assurance practices but also underscores the importance of unique electromagnetic signatures in device evaluation. As he continues to work alongside his talented colleagues, the future holds promising opportunities for further innovations in this domain.

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