The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 2021
Filed:
Aug. 18, 2017
Applicant:
The Curators of the University of Missouri, Columbia, MO (US);
Inventors:
Mohammad Tayeb Ghasr, Rolla, MO (US);
Reza Zoughi, Wildwood, MO (US);
Satyajeet Shinde, Rolla, MO (US);
Sasi Jothibasu, Rolla, MO (US);
Assignee:
THE CURATORS OF THE UNIVERSITY OF MISSOURI, Columbia, MO (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01N 22/00 (2006.01); G07D 7/10 (2006.01); G07D 7/202 (2016.01); G07D 7/1205 (2016.01); G01R 27/06 (2006.01);
U.S. Cl.
CPC ...
G01N 22/00 (2013.01); G01R 31/2879 (2013.01); G07D 7/10 (2013.01); G07D 7/1205 (2017.05); G07D 7/205 (2013.01); G01R 27/06 (2013.01); G01R 31/2896 (2013.01);
Abstract
Utilizing microwave reflections to compare a reference device with counterfeit and/or aging devices under test. The reflection from the device under test varies based on certain properties, which results in each device having a unique and intrinsic electromagnetic signature. Comparisons of the electromagnetic signature of the device under test to the electromagnetic signature of a reference device enable evaluating the acceptability of the device under test.