Osaka, Japan

Satowaka Kuroda

This inventor holds 1 USPTO granted patent. Top assignees: Martec Corporation, Matsushita Electric Industrial Co., Ltd.. Active years: 1992.


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 26(Granted Patents)


Company Filing History:


Years Active: 1992

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1 patent (USPTO):Explore Patents

Title: The Innovations of Satowaka Kuroda

Introduction

Satowaka Kuroda is a notable inventor based in Osaka, Japan. He has made significant contributions to the field of semiconductor technology. His innovative approach has led to the development of a unique testing device for semiconductor integrated circuits.

Latest Patents

Kuroda holds a patent for a device designed for testing semiconductor integrated circuits. This invention simplifies the probing test process by eliminating the need for manual adjustments of conventional probe needles. The method involves bringing conductive pattern circuits into contact with bump electrodes on a semiconductor substrate, thereby allowing for efficient testing without damaging the ICs.

Career Highlights

Throughout his career, Kuroda has worked with prominent companies such as Matsushita Electric Industrial Co., Ltd. and Martec Corporation. His experience in these organizations has contributed to his expertise in semiconductor technology and innovation.

Collaborations

Kuroda has collaborated with notable coworkers, including Kenzo Hatada and Takeshi Ishihara. Their combined efforts have further advanced the field of semiconductor testing.

Conclusion

Satowaka Kuroda's contributions to semiconductor technology through his innovative testing device highlight his importance as an inventor. His work continues to influence the industry and improve testing methodologies.

Profile summary based on public USPTO records.
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