Hidaka, Japan

Satoshi Suzuki

This inventor holds 1 USPTO granted patent. Top assignee: Jsr Corporation. Active years: 2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Satoshi Suzuki. Retrieved from https://idiyas.com/inventor/satoshi-suzuki-n6h2gvcw

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2009

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1 patent (USPTO):Explore Patents

Title: Satoshi Suzuki: Innovator in Circuit Board Inspection Technology

Introduction

Satoshi Suzuki is a notable inventor based in Hidaka, Japan. He has made significant contributions to the field of circuit board inspection technology. His innovative approach has led to the development of a unique inspection apparatus and method that addresses critical challenges in the industry.

Latest Patents

Satoshi Suzuki holds one patent for his invention titled "Inspection equipment of circuit board and inspection method of circuit board." This patent describes an apparatus and method for inspecting a circuit board that effectively absorbs variations in the height of the electrodes being inspected. It also maintains insulating properties between adjacent inspection electrodes, even when the electrodes are arranged at fine pitches.

Career Highlights

Satoshi Suzuki is currently employed at JSR Corporation, where he continues to work on advancements in inspection technologies. His expertise and innovative mindset have positioned him as a valuable asset in the field.

Collaborations

Satoshi has collaborated with notable colleagues, including Kiyoshi Kimura and Sugiro Shimoda. Their combined efforts contribute to the ongoing development of cutting-edge technologies in circuit board inspection.

Conclusion

Satoshi Suzuki's work in circuit board inspection technology exemplifies the impact of innovation in the electronics industry. His patent and contributions continue to influence the field, showcasing the importance of effective inspection methods.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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