Kawasaki, Japan

Satoshi Komiya

This inventor holds 3 USPTO granted patents. Top assignee: Fujitsu Corporation. Active years: 1994-2000.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Satoshi Komiya. Retrieved from https://idiyas.com/inventor/satoshi-komiya-eh1jrdhp

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.6

ph-index = 2

Forward Citations = 113(Granted Patents)


Company Filing History:


Years Active: 1994-2000

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3 patents (USPTO):Explore Patents

Title: Satoshi Komiya: Innovator in Semiconductor Measurement Technologies

Introduction

Satoshi Komiya is a prominent inventor based in Kawasaki, Japan. He has made significant contributions to the field of semiconductor measurement technologies. With a total of 3 patents to his name, his work has had a notable impact on the industry.

Latest Patents

Komiya's latest patents include an innovative element concentration measuring method and apparatus. This method involves irradiating X-rays to a sample that includes at least one layer of film formed on a substrate. The process measures an interference oscillation curve of the X-rays incident on the sample. It determines the concentration of an element adhered to the surface of the sample or segregated at the interface of the film. The density of the region where the element is adhered or segregated is computed based on the measured data.

Another significant patent is his film thickness measuring and film forming method. This method comprises measuring reflectances of X-rays on a film and extracting interference oscillations from the measured reflectances. By applying Fourier transformation to these oscillations, the film thickness can be computed. The method allows for the extraction of interference oscillations of a reflectance curve through a simple procedure.

Career Highlights

Satoshi Komiya is currently employed at Fujitsu Corporation, where he continues to develop and refine his innovative technologies. His work at Fujitsu has positioned him as a key player in advancing semiconductor measurement techniques.

Collaborations

Komiya has collaborated with notable coworkers, including Naoki Awaji and Shunji Kashiwagi. Their combined expertise has contributed to the success of various projects within the company.

Conclusion

Satoshi Komiya's contributions to semiconductor measurement technologies through his patents and work at Fujitsu Corporation highlight his role as an influential inventor in the field. His innovative methods continue to shape the industry and pave the way for future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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