This inventor holds 2 USPTO granted patents. Top assignee: Adv Antest Corporation. Active years: 2013.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2013
Title: Satoru Aoyama: Innovator in Frequency Measurement Technology
Introduction
Satoru Aoyama is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of frequency measurement technology. With a total of 2 patents, Aoyama's work focuses on simplifying measurement configurations and enhancing efficiency.
Latest Patents
Aoyama's latest patents include a frequency characteristics measuring device. This innovative device simplifies the configuration required for performing measurements and reduces the undue effort involved. The spectrum analyzer he developed features two sets of measuring units equipped with mixers, local oscillators, and IF sections. These units are designed to separately measure the frequency characteristics of two input signals. Additionally, a trigger generation section is included to specify measurement start timing for each set of measuring units. The sweep control section allows simultaneous instructions to the local oscillators, ensuring they output local oscillation signals of the same frequency at the same timing.
Career Highlights
Satoru Aoyama is currently employed at Adv Antest Corporation, where he continues to innovate in the field of measurement technology. His work has been instrumental in advancing the capabilities of frequency measurement devices.
Collaborations
Aoyama collaborates with talented coworkers such as Shinji Kuniie and Yoshimasa Ogino. Their combined expertise contributes to the success of their projects and innovations.
Conclusion
Satoru Aoyama is a prominent inventor whose work in frequency measurement technology has made a significant impact. His innovative patents and contributions to Adv Antest Corporation highlight his dedication to advancing measurement technology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
