Durham, NC, United States of America

Sanmitra Banerjee

This inventor holds 1 USPTO granted patent. Top assignee: Duke University. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sanmitra Banerjee. Retrieved from https://idiyas.com/inventor/sanmitra-banerjee

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: Innovations of Sanmitra Banerjee

Introduction

Sanmitra Banerjee is a notable inventor based in Durham, NC, who has made significant contributions to the field of electronic design automation. His work primarily focuses on enhancing the reliability of carbon nanotube field-effect transistor circuits through innovative testing methods.

Latest Patents

Sanmitra Banerjee holds a patent for "Variation-aware delay fault testing." This invention involves a method suitable for testing delay faults in circuits that utilize carbon nanotube field-effect transistors. The process includes generating random variation scenarios to assess the performance of the circuits under different conditions. By calculating the total delay through various paths and selecting those with the highest delays, the invention aims to improve the accuracy of delay test patterns.

Career Highlights

Sanmitra Banerjee is affiliated with Duke University, where he continues to engage in research and development in the field of electronic engineering. His work has been instrumental in advancing the understanding of fault testing in modern circuits.

Collaborations

Sanmitra collaborates with Krishnendu Chakrabarty, a fellow researcher, to further explore innovations in electronic design automation and circuit reliability.

Conclusion

Sanmitra Banerjee's contributions to the field of electronic design automation through his patent on variation-aware delay fault testing exemplify the importance of innovation in technology. His work at Duke University continues to influence advancements in circuit design and testing methodologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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