Darien, IL, United States of America

Sang-Kee Eah

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Uchicago Argonne, LLC. Active years: 2007.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sang-Kee Eah. Retrieved from https://idiyas.com/inventor/sang-kee-eah

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2007

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1 patent (USPTO):Explore Patents

Title: Sang-Kee Eah and Single-Nanoparticle Interferometry

Introduction

Sang-Kee Eah is an inventor associated with Darien, Illinois, and Uchicago Argonne, LLC. His work includes an invention that uses a single metal nanoparticle to create scattered-light interference.

Latest Patents

Eah is associated with 1 patent, titled “Single Metal Nanoparticle Scattering Interferometer.” The invention uses a single metal nanoparticle as a beam splitter for incoming excitation light. Scattered light from the nanoparticle and its mirror image interferes across spatial and spectral domains. The mirror changes the spatial distribution of elastic scattering, while the scattered light’s broad spectral width enables distance measurement without scanning the mirror.

Career Highlights

The patent reflects Eah’s work on optical measurement techniques that use nanoparticle scattering and interference. His listed company affiliation is Uchicago Argonne, LLC.

Collaborations

Eah’s listed coworkers include Xiao-Min Lin and Gary P. Wiederrecht.

Conclusion

Sang-Kee Eah’s patent presents a nanoparticle-based interferometer designed to measure distance through scattered-light interference without requiring mirror scanning.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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