Company Filing History:
Years Active: 2006-2009
Title: Innovations of Sang-Joon Han
Introduction
Sang-Joon Han is a prominent inventor based in Seoul, South Korea. He has made significant contributions to the field of technology, particularly in the areas of component analysis and regression modeling. With a total of 5 patents to his name, Han continues to push the boundaries of innovation.
Latest Patents
One of Han's latest patents is an "Apparatus and method for analyzing component using microscopic regions." This invention includes an image obtainer that captures images of parts of a living body. It also features a color information generator that produces color information from the obtained image, which is then transformed into a product of first and second matrixes. The component analyzer analyzes the components of the image using these matrixes, allowing for a detailed examination of microscopic regions. Another notable patent is the "Method of determining a weighted regression model and method of predicting a component concentration of mixture using the weighted regression model." This method involves selecting a regression model, generating observation points, and determining weights to minimize calculation amounts, ultimately leading to accurate predictions of component concentrations.
Career Highlights
Sang-Joon Han is currently employed at Samsung Electronics Co., Ltd., where he applies his expertise in technology and innovation. His work at Samsung has allowed him to develop groundbreaking technologies that enhance the company's product offerings.
Collaborations
Han has collaborated with notable coworkers, including In-duk Hwang and Gil-Won Yoon. These partnerships have contributed to the successful development of his patents and innovations.
Conclusion
Sang-Joon Han is a distinguished inventor whose work has significantly impacted the field of technology. His innovative patents and contributions to Samsung Electronics Co., Ltd. highlight his dedication to advancing technology and improving component analysis methods.