The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2009

Filed:

Jun. 06, 2005
Applicant:

Sang-joon Han, Seoul, KR;

Inventor:

Sang-Joon Han, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus for and a method of analyzing components using microscopic regions. The apparatus includes: an image obtainer obtaining an image of a part of a living body; a color information generator generating color information of an image having a matrix pattern from a size of the microscopic regions and the obtained image; a first data transformer transforming the color information of the image into a product of first and second matrixes; and a component analyzer analyzing components of the obtained image using at least one of the first and second matrixes. When the obtained image is divided into a plurality of microscopic regions, the size of the microscopic regions is determined so that concentrations of components of the part fluctuate in each of the microscopic regions.


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