The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2006
Filed:
Mar. 17, 2004
In-duk Hwang, Suwon-si, KR;
Gil-won Yoon, Seoul, KR;
Sang-joon Han, Seoul, KR;
Kye-jin Jeon, Suwon-si, KR;
In-duk Hwang, Suwon-si, KR;
Gil-won Yoon, Seoul, KR;
Sang-joon Han, Seoul, KR;
Kye-jin Jeon, Suwon-si, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
A method of measuring a concentration of a component in a subject includes setting an intensity relationship equation between a positive-order beam and a negative-order beam with respect to a reference matter at a particular wavelength, applying a light having a first wavelength band absorbed by the component and detecting an intensity of a positive-order beam output from the subject and an intensity of a negative-order beam output from the reference matter, the positive-order beam and the negative-order beam having a second wavelength band, calculating an intensity of a positive-order beam input to the subject by applying the intensity of the negative-order beam output from the reference matter to the intensity relationship equation, and calculating absorbance using the intensity of the positive-order beam output from the subject and the intensity of the positive-order beam input to the subject and measuring a concentration of the component using the absorbance.