Suwon-si, South Korea

Sang-Joon Cho


Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: Innovations of Sang-Joon Cho in Atomic Force Microscopy

Introduction

Sang-Joon Cho is a notable inventor based in Suwon-si, South Korea. He has made significant contributions to the field of atomic force microscopy, particularly through his innovative patent that enhances the capabilities of this technology. His work is instrumental in advancing the methods used to acquire information on the surfaces of various measurement targets.

Latest Patents

Sang-Joon Cho holds a patent for an "Atomic force microscope equipped with optical measurement device and method of acquiring information on surface of measurement target using the same." This invention involves an atomic force microscope that integrates an optical measurement device. The device is designed to acquire characteristics of a surface by moving a probe along the surface while scanning it on an XY plane. The optical measurement device includes a lighting unit that allows light to enter the surface and a detection unit that captures the light reflected from the surface. This innovative approach enables more precise surface characterization.

Career Highlights

Sang-Joon Cho is associated with Park Systems Corporation, a company known for its advancements in atomic force microscopy technology. His role at the company has allowed him to contribute to cutting-edge research and development in this field. His expertise and innovative mindset have positioned him as a key figure in the advancement of measurement technologies.

Collaborations

Sang-Joon Cho has collaborated with notable colleagues such as Sang-il Park and Byoung-Woon Ahn. These collaborations have fostered a productive environment for innovation and have led to significant advancements in their respective fields.

Conclusion

Sang-Joon Cho's contributions to atomic force microscopy through his innovative patent demonstrate his commitment to advancing measurement technologies. His work continues to influence the field and showcases the importance of innovation in scientific research.

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