Busan, South Korea

Sang Heon Ye

This inventor holds 1 USPTO granted patent. Top assignees: K-Mac, Korea Research Institute of Standards and Science. Active years: 2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sang Heon Ye. Retrieved from https://idiyas.com/inventor/sang-heon-ye-wru1ockw

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 9.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2011

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1 patent (USPTO):Explore Patents

Title: The Innovations of Sang Heon Ye

Introduction

Sang Heon Ye is a notable inventor based in Busan, South Korea. He has made significant contributions to the field of optical measurement technology. His work primarily focuses on the development of advanced ellipsometers.

Latest Patents

Sang Heon Ye holds a patent for a focused-beam ellipsometer. This invention relates to an ellipsometer designed to determine the optical properties of a sample. It achieves this by analyzing the variation of the polarization of light that has a specific polarization and is reflected off the surface of the sample. He has 1 patent to his name.

Career Highlights

Throughout his career, Sang Heon Ye has worked with esteemed organizations such as the Korea Research Institute of Standards and Science and K-MAC. His experience in these institutions has allowed him to refine his skills and contribute to significant advancements in optical technology.

Collaborations

Sang Heon Ye has collaborated with notable colleagues, including Joong Whan Lee and Young June Ko. Their combined expertise has fostered innovation and development in their respective fields.

Conclusion

Sang Heon Ye's contributions to optical measurement technology through his focused-beam ellipsometer highlight his innovative spirit and dedication to advancing scientific understanding. His work continues to influence the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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