Company Filing History:
Years Active: 2010-2011
Title: Innovations by Samuel Ngai in Solar Photovoltaic Technology
Introduction
Samuel Ngai is an accomplished inventor based in San Francisco, CA. He has made significant contributions to the field of solar photovoltaic technology, holding 2 patents that focus on improving the quality and efficiency of solar wafers.
Latest Patents
One of Samuel Ngai's latest patents is titled "Priori crack detection in solar photovoltaic wafers by detecting bending at edges of wafers." This patent discloses methods and systems for determining the quality of a substrate. The process involves examining one or more substrates to identify any bending present at the edges. If no bending is detected, the substrate is accepted; if bending is present, the substrate is rejected. Another notable patent is "Defect detection using time delay lock-in thermography (LIT) and dark field LIT." This innovation aims to increase inspection throughput by moving the field of view of an IR camera over the sample at a constant velocity. During this movement, modulation can be applied to the sample, and IR images are captured, allowing for effective defect identification.
Career Highlights
Samuel Ngai is currently employed at Kla Tencor Corporation, where he continues to develop innovative solutions in the field of solar technology. His work has been instrumental in advancing the methods used for quality assurance in solar photovoltaic manufacturing.
Collaborations
Samuel collaborates with talented individuals such as Ady Levy and Guoheng Zhao, contributing to a dynamic team focused on innovation and excellence in their field.
Conclusion
Samuel Ngai's contributions to solar photovoltaic technology through his patents demonstrate his commitment to enhancing the quality and efficiency of solar energy solutions. His work continues to impact the industry positively.