Toronto, Canada

Sam Ho

This inventor holds 1 USPTO granted patent. Top assignee: Ati Technologies Inc.. Active years: 2000.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sam Ho. Retrieved from https://idiyas.com/inventor/sam-ho-ijbw7ua3

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2000

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1 patent (USPTO):Explore Patents

Title: Sam Ho and Application-Specific Circuit Testing

Introduction

Sam Ho is an inventor associated with Toronto, Canada, and ATI Technologies Inc. His patent work addresses automated testing of assembled circuits, coordinating test equipment, testing programs, and circuit handling.

Latest Patents

The available information identifies one patent associated with Sam Ho: Method and Apparatus for Application-Specific Testing of Assembled Circuits. The method configures application-specific testing entities according to the types of assembled circuits being tested and supplies each entity with a corresponding test program. It also provides instructions to a programmable handler to position circuits for testing and replace them after testing is complete. The patent record lists 1 patent.

Career Highlights

Ho’s documented invention focuses on coordinating circuit testing and automated handling. By matching test programs and testing entities to circuit types, the described approach supports application-specific testing workflows.

Collaborations

The provided information names Lee K. Lau and Roy Schoonover as Ho’s coworkers. It does not specify their roles in the patent or describe particular collaborative contributions.

Conclusion

Sam Ho’s listed patent describes an integrated approach to application-specific circuit testing, combining configurable test equipment, tailored programs, and programmable circuit handling.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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