The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 14, 2000

Filed:

Oct. 02, 1998
Applicant:
Inventors:

Roy Schoonover, Mississauga, CA;

Albert Man, Richmond Hill, CA;

Sam Ho, Toronto, CA;

Lee Lau, Don Mills, CA;

Assignee:

ATI Technologies, Inc, Thornhill, CA;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ; H01L / ;
U.S. Cl.
CPC ...
702117 ; 702118 ; 702121 ; 702123 ;
Abstract

A method and apparatus for testing specific assembled circuits begins by configuring a plurality of applications specific testing entities to test assembled circuits, where the configuring is based on the types of assembled circuits being tested. Next, a specific assembled circuit testing program is provided to the corresponding application specific testing entity based on the type of assembled circuits it is testing. In addition to providing the testing programs to the testing entities, programming instructions are provided to a programmable handler to pick and place the appropriate assembled circuits with the corresponding applications specific testing entities. When the testing of a particular assembled circuit is complete, a test complete indication is provided. When the test complete indication is received by the host, programming instructions are provided to the programmable handler to remove the integrated circuit from the testing entity and place another integrated circuit in the proximity of the testing entity for subsequent testing.


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