Sam Ekong

Title: Sam Ekong - Innovator in Depth Image Quality Assessment

Introduction

Sam Ekong is a notable inventor based in Mountain View, CA (US). He has made significant contributions to the field of depth image processing, particularly in the assessment of image quality. His innovative approach has implications for various applications, including device security and sensor calibration.

Latest Patents

Sam Ekong holds a patent for a method titled "Measuring quality of depth images in real time." This patent outlines techniques to determine a quality score for depth maps. The quality score is derived from metrics that identify artifacts or inaccuracies in the depth map, such as flat patches, artifactual edges, and patchy regions. The methodology includes a flatness metric to detect regions with similar depth values, a jaggedness metric for identifying hard edges, and a patchiness metric for recognizing enclosed regions. These metrics are normalized and combined to produce an overall quality score, which can be compared against thresholds to assign a quality label. This label can be utilized for various operations, including unlocking devices and recalibrating depth sensors.

Career Highlights

Sam Ekong is currently employed at Google Inc., where he continues to innovate in the realm of depth image processing. His work has positioned him as a key player in enhancing the quality and reliability of depth imaging technologies.

Collaborations

Throughout his career, Sam has collaborated with talented individuals such as Wen-Sheng Chu and Kuntal Sengupta. These collaborations have fostered a creative environment that encourages the development of cutting-edge technologies.

Conclusion

Sam Ekong's contributions to depth image quality assessment exemplify the impact of innovative thinking in technology. His patent and ongoing work at Google Inc. highlight the importance of quality metrics in enhancing device functionality and user experience.