The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 21, 2021
Filed:
Jun. 15, 2020
Google Llc, Mountain View, CA (US);
Wen-Sheng Chu, Menlo Park, CA (US);
Sam Ekong, Mountain View, CA (US);
Kuntal Sengupta, Mountain View, CA (US);
Google LLC, Mountain View, CA (US);
Abstract
Methods are provided to determine a quality score for depth map. The quality score is calculated from metrics that detect artifacts or other inaccuracies in the depth map such as flat patches, artifactual edges, and patchy regions. A flatness metric detects regions of neighboring pixels that have substantially the same depth value. A jaggedness metric detects hard edges or other discontinuities. A patchiness metric detects regions that are wholly enclosed by an edge and that have sub-threshold areas. The individual metrics are normalized and combined to determine an overall quality score for the depth map. The quality score can then be compared to one or more thresholds to determine a quality label for the depth map. Such a quality label can then be used to unlock a device, to invalidate an unlock attempt, to recalibrate a depth sensor, or to perform some other operations.