Salvatore T Fahey

Title: Salvatore T. Fahey: Innovator in Electron Beam Micro Analysis

Introduction

Salvatore T. Fahey is a notable inventor based in Oakland, CA, recognized for his contributions to the field of electron beam micro analysis. With a focus on innovative measurement techniques, Fahey has developed methods that enhance the understanding of material properties at a microscopic level.

Latest Patents

Fahey holds a patent for a method titled "Site Stepping for Electron Beam Micro Analysis." This invention involves measuring properties of a sample using an electron beam. The process defines coordinates of a measurement site on the sample and the diameter of the electron beam. Multiple measurement locations are determined within the measurement site, ensuring that the electron beam substantially covers the area of interest. By directing the electron beam to these locations, properties of the sample can be accurately measured.

Career Highlights

Fahey is associated with Kla-Tencor Technologies Corporation, where he applies his expertise in electron beam technology. His work has significantly contributed to advancements in micro analysis techniques, making him a valuable asset in the field.

Collaborations

Throughout his career, Fahey has collaborated with notable colleagues, including Roger L. Kroeze and David Aitan Soltz. These partnerships have fostered innovation and have led to the development of cutting-edge technologies in electron beam analysis.

Conclusion

Salvatore T. Fahey's work in electron beam micro analysis exemplifies the impact of innovative thinking in scientific research. His patent and contributions to Kla-Tencor Technologies Corporation highlight his role as a key figure in advancing measurement techniques in material science.