Dundee, United Kingdom

Sai Teja Kasha

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Ncr Atleos Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sai Teja Kasha. Retrieved from https://idiyas.com/inventor/sai-teja-kasha

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Sai Teja Kasha and Patent Innovation

Introduction

Sai Teja Kasha is an inventor associated with Dundee, GB, and NCR Atleos Corporation. His patent work addresses the use of image analysis to support compliance during terminal servicing.

Latest Patents

The provided information lists one patent for Kasha: “Technician service action auditing for compliance.” The invention captures images of terminal components during a technician’s service call and analyzes them to assess whether the actions taken are compliant. If the system detects a non-compliant action, it can send a real-time alert to the technician or the site manager. In one embodiment, it also provides the technician with a model image showing a compliant action. Kasha is credited with 1 patent in the supplied data.

Career Highlights

Kasha’s listed patent focuses on applying image-based monitoring to service workflows. By identifying potential issues during a service call, the system is designed to help technicians and site managers address compliance concerns promptly.

Collaborations

The supplied information names Michael James Neilan and Mark William Reilly as Kasha’s coworkers. It does not specify their roles in the patent or the invention.

Conclusion

Sai Teja Kasha’s listed invention combines image analysis and real-time alerts to support compliant terminal servicing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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