Company Filing History:
3 out of 41 
3 out of 73 
3 out of 1,008 
Years Active: 2021-2022
Title: Sachiko Yoshida: Innovator in Surface Property Measurement Technology
Introduction
Sachiko Yoshida is a prominent inventor based in Aichi, Japan. She has made significant contributions to the field of surface property measurement technology, holding three patents that showcase her innovative approach to evaluating surface properties with high accuracy.
Latest Patents
Her latest patents include a surface property measurement method, a surface property measurement apparatus, and a recording medium. The surface property measurement technology allows for the evaluation of a substance's surface properties with high precision. The method involves radiating an ultrasonic wave to a measurement target and acquiring a reflected signal. A measurement apparatus calculates the maximum value of a cross-correlation function between the reflected signal and a reference signal. This process enables the calculation of a reflection component at an interface, ultimately outputting a measurement value related to acoustic impedance.
Another notable patent is an ultrasonic measurement method that includes irradiating an object with an ultrasonic wave and acquiring a reflection wave. A processor calculates the acoustic impedance in the depth direction of the object and estimates the object's thickness based on an inflection point determined by second-order differentiation of the acoustic impedance.
Career Highlights
Throughout her career, Sachiko has worked with notable organizations such as Shiseido Company, Limited and Toyohashi University of Technology. Her work in these institutions has allowed her to further develop her expertise in ultrasonic measurement technologies.
Collaborations
Sachiko has collaborated with esteemed colleagues, including Yuki Ogura and Naohiro Hozumi, contributing to advancements in her field.
Conclusion
Sachiko Yoshida's innovative work in surface property measurement technology has established her as a key figure in her field. Her patents reflect her dedication to enhancing measurement accuracy and her contributions to the scientific community are commendable.