The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2022
Filed:
Sep. 13, 2016
Shiseido Company, Ltd., Tokyo, JP;
National University Corporation Toyohashi University of Technology, Aichi, JP;
Honda Electronics Co., Ltd., Aichi, JP;
Yuki Ogura, Kanagawa, JP;
Naohiro Hozumi, Aichi, JP;
Sachiko Yoshida, Aichi, JP;
Kazuto Kobayashi, Aichi, JP;
Yusuke Hara, Kanagawa, JP;
SHISEIDO COMPANY, LTD., Tokyo, JP;
NATIONAL UNIVERSITY CORPORATION TOYOHASHI UNIVERSITY OF TECHNOLOGY, Aichi, JP;
HONDA ELECTRONICS CO., LTD., Aichi, JP;
Abstract
A surface property measurement technology by which a surface property of a substance can be evaluated with high accuracy, is provided. A surface property measurement method includes radiating an ultrasonic wave to a measurement target and acquiring a reflected signal from the measurement target; calculating, by a measurement apparatus, a maximum value of a cross-correlation function between the reflected signal from the measurement target and a reference reflected signal from a reference substance acquired in advance; calculating a reflection component at an interface, by using the maximum value of the cross-correlation function; and outputting, as a measurement value, one of an acoustic impedance of the measurement target or an acoustic impedance of the reference substance, according to a result of comparing the reflection component with the reference reflected signal.