Shiseido Company, Limited

Toyohashi University of Technology

Honda Electronics Co., Ltd.

Sachiko Yoshida

Naohiro Hozumi

Kazuto Kobayashi

Yuki Ogura

Yusuke Hara

A surface property measurement technology by which a surface property of a substance can be evaluated with high accuracy, is provided. A surface property measurement method includes radiating an ultrasonic wave to a measurement target and acquiring a reflected signal from the measurement target; calculating, by a measurement apparatus, a maximum value of a cross-correlation function between the reflected signal from the measurement target and a reference reflected signal from a reference substance acquired in advance; calculating a reflection component at an interface, by using the maximum value of the cross-correlation function; and outputting, as a measurement value, one of an acoustic impedance of the measurement target or an acoustic impedance of the reference substance, according to a result of comparing the reflection component with the reference reflected signal.

Surface property measurement method, surface property measurement apparatus, and recording medium

An ultrasonic measurement method includes irradiating an object to be measured with an ultrasonic wave, acquiring a reflection wave from the object, calculating at a processor an acoustic impedance in a depth direction of the object from the reflection wave, and estimating and outputting a thickness of the object based upon an inflection point determined by second-order differentiation of the acoustic impedance.

Ultrasonic measurement method, ultrasonic measurement apparatus, and program storage device readable by machine

An ultrasonic-image-construction apparatus can construct an ultrasonic-tomographic image of a thin, layer-structured target object to be measured relatively easily and highly accurately in a manner in which such layered structure is easily understood. An ultrasonic transducer of an ultrasonic-image-constructing apparatus transmits ultrasonic waves to the target object. A reference substance makes contact with a base substrate, with such ultrasonic waves being incident on the target object via the base substrate, then receives an impulse response of an ultrasonic waveform. A computing means performs calculation to estimate acoustic-physical-property distribution in consideration of the multiple-reflections influence based on normalized-impulse information obtained from impulse-response information of such ultrasonic waveform incident on the reference substance and from impulse-response information of such ultrasonic waveform incident on the target object. The image-construction means constructs acoustic-physical-property-image data based on acoustic-physical-property distribution in the depth direction obtained by computing means.

Growing community of inventors

Aichi, Japan

Sachiko Yoshida