Hong Kong, China

Saber Nasraoui

This inventor holds 2 USPTO granted patents. Top assignee: The Hong Kong University of Science and Technology. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Saber Nasraoui. Retrieved from https://idiyas.com/inventor/saber-nasraoui

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 4.0

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Company Filing History:


Years Active: 2026

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2 patents (USPTO):Explore Patents

Title: Innovations by Saber Nasraoui in Defect Detection Technology

Introduction

Saber Nasraoui is an accomplished inventor based in Hong Kong, CN. He has made significant contributions to the field of defect detection, particularly in pressurized pipe systems. His innovative approach utilizes high-frequency waves to identify defects, enhancing safety and reliability in various applications.

Latest Patents

Saber Nasraoui holds a patent for a "Defect detection method and system using high frequency waves." This method involves generating a probing wave within a frequency range of 10 kHz to 100 kHz, which is scattered by defects in a pressurized pipe. The reflected wave is then measured to locate the defects accurately. This patent showcases his expertise in acoustic technology and its practical applications in engineering.

Career Highlights

Saber Nasraoui is affiliated with The Hong Kong University of Science and Technology, where he contributes to research and development in engineering. His work focuses on innovative solutions that address real-world challenges in defect detection and monitoring systems.

Collaborations

Saber has collaborated with notable colleagues, including Georgios Grigoropoulos and Moez Louati. These partnerships have fostered a collaborative environment that encourages the exchange of ideas and advancements in technology.

Conclusion

Saber Nasraoui's contributions to defect detection technology exemplify the impact of innovative thinking in engineering. His patent and ongoing research continue to pave the way for advancements in safety and efficiency in various industries.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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