The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2026
Filed:
Dec. 29, 2023
The Hong Kong University of Science and Technology, Hong Kong, CN;
Georgios Grigoropoulos, Hong Kong, CN;
Saber Nasraoui, Hong Kong, CN;
Moez Louati, Hong Kong, CN;
Mohamed Salah Ghidaoui, Hong Kong, CN;
The Hong Kong University of Science and Technology, Hong Kong, CN;
Abstract
A defect detection method is provided for a pressurized pipe having at least one defect. According to the method, an acoustic source generates a probing wave of a frequency range from 10 kHz to 100 kHz, where the probing wave is scattered by the at least one defect to create a reflected wave; an acoustic receiver measures a wave response to obtain a measured response, where the measured response is attributed essentially to a superposition of the probing wave and the reflected wave; and a computer device processes the measured response to locate the at least one defect.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile