Atsugi, Japan

Ryuichi Kawakami

This inventor holds 1 USPTO granted patent. Top assignee: Sintokogio, Ltd.. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ryuichi Kawakami. Retrieved from https://idiyas.com/inventor/ryuichi-kawakami-brvdqdi0

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Ryuichi Kawakami: Innovator in Inspection Technology

Introduction

Ryuichi Kawakami is a notable inventor based in Atsugi, Japan. He has made significant contributions to the field of inspection technology, particularly through his innovative patent related to inspection devices.

Latest Patents

Kawakami holds a patent for an inspection device and casting system. This device inspects the appearance of a target and includes an imaging device that captures images from different directions. The illuminating unit applies light to the target, while the controller acquires inspection images from two positions to assess the target's appearance based on these images and a reference image.

Career Highlights

Kawakami is associated with Sintokogio, Ltd., where he has been instrumental in developing advanced inspection technologies. His work has enhanced the efficiency and accuracy of inspection processes in various applications.

Collaborations

He has collaborated with notable coworkers, including Kazuhiro Ota and Tsutomu Seki, contributing to the advancement of their projects and innovations.

Conclusion

Ryuichi Kawakami's contributions to inspection technology through his patent demonstrate his innovative spirit and commitment to improving industry standards. His work continues to influence the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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