The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 2021
Filed:
May. 10, 2018
Sintokogio, Ltd., Nagoya, JP;
Kazuhiro Ota, Toyokawa, JP;
Tsutomu Seki, Toyokawa, JP;
Yoshimitsu Ichino, Toyokawa, JP;
Junichi Iwasaki, Toyokawa, JP;
Takeshi Sonohara, Toyokawa, JP;
Ryuichi Kawakami, Atsugi, JP;
Tatsuya Aoki, Atsugi, JP;
SINTOKOGIO, LTD., Nagoya, JP;
Abstract
An inspection device is a device that inspects the appearance of a target, including: an imaging device configured to image the target from a first direction; an illuminating unit configured to apply light to the target; and a controller configured to acquire a first inspection image by causing the imaging device to image the target to which light is applied from a first position, to acquire a second inspection image by causing the imaging device to image the target to which light is applied from a second position, and to inspect an appearance of the target based on the first inspection image, the second inspection image, and a reference image. The first position and the second position overlap each other when viewed from the first direction.