Tokyo, Japan

Ryotaro Okuda

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Asahi Kasei Microdevices Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ryotaro Okuda. Retrieved from https://idiyas.com/inventor/ryotaro-okuda

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Ryotaro Okuda: Innovator in Optical Density Measurement

Introduction

Ryotaro Okuda is a prominent inventor based in Tokyo, Japan. He is known for his contributions to the field of optical measurement technology. His innovative approach has led to the development of a unique optical density measuring apparatus.

Latest Patents

Ryotaro Okuda holds 1 patent for his invention titled "Optical Density Measuring Apparatus." This compact and highly accurate device incorporates an ellipsoidal mirror and a folding mirror. The design features a light guiding part, where the inner surface is shaped like a portion of an ellipsoid. Additionally, the apparatus ensures that 60% or more of the area of both the light source and light receiving regions are effectively utilized.

Career Highlights

Okuda is currently employed at Asahi Kasei Microdevices Corporation, where he continues to innovate in the field of optical devices. His work has significantly advanced the accuracy and efficiency of optical measurements.

Collaborations

One of his notable collaborators is Takaaki Furuya, with whom he has worked on various projects related to optical technology.

Conclusion

Ryotaro Okuda's contributions to optical measurement technology exemplify the spirit of innovation. His patented optical density measuring apparatus showcases his commitment to advancing the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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