The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2026

Filed:

Oct. 31, 2024
Applicant:

Asahi Kasei Microdevices Corporation, Tokyo, JP;

Inventors:

Takaaki Furuya, Tokyo, JP;

Ryotaro Okuda, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/61 (2006.01); G01N 21/03 (2006.01);
U.S. Cl.
CPC ...
G01N 21/61 (2013.01); G01N 21/03 (2013.01); G01N 2021/0378 (2013.01);
Abstract

A compact and highly accurate optical density measuring apparatus that includes an ellipsoidal mirror and a folding mirror is provided. In the optical density measuring apparatus, the shape of at least a part of the inner surface of a light guiding part is composed of a figure of a part of an ellipsoid E, and a shape of at least a part of another portion of the inner surface of the light guiding part is composed of a figure of a part of a plane or a quadric surface. 60% or more of the area of a light source region of a light emitting part is present in a region R, and 60% or more of the area of a light receiving region of a light receiving part is present in a region R.


Find Patent Forward Citations

Furuya, Takaaki. (2026). Optical density measuring apparatus (U.S. Patent No. 12674755). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12674755

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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