This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Horiba Stec, Co., Ltd.. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Ryosuke Ogaki: Inventor in Pattern Measurement
Introduction
Ryosuke Ogaki is an inventor associated with Kyoto, Japan, and Horiba Stec, Co., Ltd. His patent work focuses on measuring pattern dimensions accurately through statistical processing.
Latest Patents
Ogaki is associated with 1 patent: “Pattern Measurement Device, Pattern Measurement Program, and Pattern Measurement Method.” The invention measures dimensions of patterns formed on a sample. It applies outlier processing at least twice to measured dimension values, then determines a representative dimension from the values remaining after outliers are removed. This approach is designed to improve the accuracy of pattern measurement.
Career Highlights
Ogaki’s listed patent reflects work in pattern measurement technology and statistical outlier processing. He is associated with Horiba Stec, Co., Ltd.
Collaborations
His listed coworkers include Seiji Higuchi and Takayuki Ueda.
Conclusion
Ryosuke Ogaki’s patent describes a method for deriving representative pattern dimensions by repeatedly filtering outliers, contributing to more accurate measurement.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile