Iga, Japan

Ryosuke Murakami

This inventor holds 1 USPTO granted patent. Top assignee: Yasunaga Corporation. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ryosuke Murakami. Retrieved from https://idiyas.com/inventor/ryosuke-murakami-c70nkfg9

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: Ryosuke Murakami: Innovator in Fracture Surface Inspection Technology

Introduction

Ryosuke Murakami is a notable inventor based in Iga, Japan. He has made significant contributions to the field of fracture surface inspection technology. His innovative approach has led to the development of a unique device that enhances the evaluation of fractures in various materials.

Latest Patents

Ryosuke Murakami holds a patent for a "Fracture surface inspection device and fracture surface inspection method for loss evaluation." This device is designed to inspect both the first and second fracture surfaces generated through fracture splitting. It features a data acquisition unit that collects two-dimensional and three-dimensional data on each fracture surface. Additionally, it includes a contour extraction unit that identifies the contours of the fracture surfaces, a transformation amount calculation unit for calculating affine transformations, a distortion correction unit for adjusting three-dimensional data, and a comparison unit for analyzing the data.

Career Highlights

Ryosuke Murakami is associated with Yasunaga Corporation, where he applies his expertise in developing advanced inspection technologies. His work has been instrumental in improving the accuracy and efficiency of fracture evaluations in various industrial applications.

Conclusion

Ryosuke Murakami's contributions to fracture surface inspection technology exemplify the impact of innovative thinking in engineering. His patented device represents a significant advancement in the field, showcasing his dedication to enhancing material evaluation processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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