The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 2023
Filed:
Nov. 19, 2020
Yasunaga Corporation, Iga, JP;
Ryosuke Murakami, Iga, JP;
YASUNAGA CORPORATION, Iga, JP;
Abstract
A fracture surface inspection device for inspecting a first fracture surface and a second fracture surface that are generated through fracture splitting, which is provided with a data acquisition unit configured to acquire two-dimensional data and three-dimensional data on each of the fracture surfaces, a contour extraction unit configured to extract, from the two-dimensional data, a first contour of the first fracture surface and a second contour of the second fracture surface, a transformation amount calculation unit configured to calculate a transformation amount X(affine) when the second contour is affine-transformed to the first contour, a distortion correction unit configured to calculate distortion correction data by affine-transforming the three-dimensional data on the second fracture surface with the transformation amount X(affine), and a comparison unit configured to compare the three-dimensional data on the first fracture surface and the distortion correction data.