Kanagawa, Japan

Ryoji Yoshikawa


Average Co-Inventor Count = 1.9

ph-index = 2

Forward Citations = 11(Granted Patents)


Location History:

  • Yokohama, JP (2009 - 2010)
  • Kanagawa-ken, JP (2014 - 2016)
  • Kanagawa, JP (2013 - 2021)

Company Filing History:


Years Active: 2009-2021

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7 patents (USPTO):Explore Patents

Title: Ryoji Yoshikawa - Innovator in Defect Inspection Technology

Introduction

Ryoji Yoshikawa is a prominent inventor based in Kanagawa, Japan. He has made significant contributions to the field of defect inspection technology, holding a total of seven patents. His work focuses on enhancing the accuracy and efficiency of defect detection in various applications.

Latest Patents

Among his latest innovations is a defect inspection device and method. This device utilizes an image sensor to capture images of target regions and divides them into an array of pixels. The processor within the device analyzes these pixels to assess defects based on property values and threshold differences. Another notable patent is a pattern inspection apparatus that captures images of inspection target objects and outputs position information related to defects, improving the reliability of inspections.

Career Highlights

Ryoji has had a distinguished career, working with notable companies such as Toshiba Corporation and Toshiba Memory Corporation. His experience in these organizations has allowed him to develop and refine his innovative technologies in defect inspection.

Collaborations

Throughout his career, Ryoji has collaborated with talented individuals, including Hidehiro Watanabe and Tomohiro Tsutsui. These partnerships have contributed to the advancement of his research and the successful development of his patented technologies.

Conclusion

Ryoji Yoshikawa's contributions to defect inspection technology have established him as a key figure in the field.

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