Tokyo, Japan

Ryo Yonetani

USPTO Granted Patents = 6 

 

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2021-2025

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6 patents (USPTO):Explore Patents

Title: Ryo Yonetani: Innovator in Model Generation Technology

Introduction

Ryo Yonetani is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of model generation technology, holding a total of 6 patents. His work focuses on enhancing defect detection and feature identification through innovative methodologies.

Latest Patents

Yonetani's latest patents include a model generation apparatus, an estimation apparatus, a model generation method, and a computer-readable storage medium that stores a model generation program. One of his notable inventions involves training a model by converting training data to deliberately reduce estimation performance, which ultimately improves defect detection and feature identification. This model generation apparatus executes operations with respect to each learning data set, including training a second estimator and a coder alternately and repeatedly.

Another significant patent involves a regression apparatus that trains a neural network module through machine learning. This apparatus performs an extraction operation to identify elements satisfying predetermined conditions from a set of targets. During the machine learning process, the model generation apparatus replaces the extraction operation with a differentiable alternative during backpropagation to compute an approximate gradient.

Career Highlights

Ryo Yonetani is currently employed at Omron Corporation, where he continues to develop innovative technologies. His work has been instrumental in advancing the capabilities of model generation and estimation apparatuses.

Collaborations

Yonetani collaborates with talented individuals such as Masaki Suwa and Mohammadamin Barekatain, contributing to a dynamic and innovative work environment.

Conclusion

Ryo Yonetani's contributions to model generation technology exemplify his commitment to innovation and excellence. His patents reflect a deep understanding of machine learning and its applications in defect detection and feature identification.

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