The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 26, 2024
Filed:
Jun. 25, 2020
Omron Corporation, Kyoto, JP;
Ryo Yonetani, Tokyo, JP;
Masaki Suwa, Tokyo, JP;
Mohammadamin Barekatain, Tokyo, JP;
Yoshihisa Ijiri, Tokyo, JP;
Hiroyuki Miyaura, Kyoto, JP;
OMRON CORPORATION, Kyoto, JP;
Abstract
An inference apparatus provides target data to multiple inference models to cause the inference models each derived from local learning data obtained in a different environment to perform predetermined inference to obtain an inference result from each of the inference models. The inference apparatus determines the value of each combining parameter using environment data, weights the inference result from each of the inference models using the determined value of each combining parameter, and combines the weighted inference result from each inference model together to generate an inference result in a target environment.