San Antonio, TX, United States of America

Ryan McBee


Average Co-Inventor Count = 12.0

ph-index = 1


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: The Innovative Mind of Ryan McBee: A Patent Overview

Introduction: Ryan McBee, an inventive mind based in San Antonio, TX, has made notable contributions to the field of engineering through his innovative patent. Working with Lockheed Martin Corporation, McBee's work reflects a commitment to improving technological capabilities within the aerospace and defense sectors.

Latest Patents: McBee holds a patent for a "Digital Grip Gauge with Shaped Tip." This innovative apparatus comprises one or more probes, a conically shaped tip, a pin, and a measurement device. The design allows the probes to be inserted through an aperture in a component, where the tip and pin can move to measure grip length accurately. This invention demonstrates McBee's ability to blend functionality with precision, catering to the specific needs of various mechanical applications.

Career Highlights: Throughout his career at Lockheed Martin Corporation, Ryan McBee has focused on developing tools and mechanisms that enhance operational efficiency. His lone patent marks a significant milestone, showcasing his technical expertise and innovative spirit in an industry that thrives on precision and advancement.

Collaborations: During his tenure, McBee has collaborated with notable coworkers such as Jonathan Richard Olson and Tyler Martin Rup. These partnerships highlight the collaborative environment at Lockheed Martin, where teamwork drives innovation and leads to successful inventions.

Conclusion: Ryan McBee's contributions to the field of engineering, encapsulated in his patent for a Digital Grip Gauge with Shaped Tip, underscore the importance of innovation in modern technology. As he continues to work at Lockheed Martin Corporation, McBee stands as an example of how individual creativity can lead to advancements that benefit both the industry and society at large.

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