The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2022
Filed:
Mar. 30, 2020
Lockheed Martin Corporation, Bethesda, MD (US);
Jonathan Richard Olson, Fort Worth, TX (US);
Tyler Martin Rup, Fort Worth, TX (US);
Philip Michael Chovanec, Fort Worth, TX (US);
Matthew Timothy McKee, Fort Worth, TX (US);
Alondra Renee Guevara, Fort Worth, TX (US);
Carl Bargainer, Fairview, OR (US);
Glynn Bartlett, Boerne, TX (US);
Thomas E. Lyons, Jr., Rio Medina, TX (US);
J. Mark Major, San Antonio, TX (US);
Ryan McBee, San Antonio, TX (US);
Paul Wood, Helotes, TX (US);
Stephen L. Wiedmann, San Antonio, TX (US);
Lockheed Martin Corporation, Bethesda, MD (US);
Abstract
In an embodiment, an apparatus includes one or more probes, a tip, a pin, and a measurement device. The one or more probes may be configured for insertion through an aperture in a component. The tip may be slidably engaged with the one or more probes and include a first end configured to contact a first surface of the component. The first end of the tip may be conically shaped. The pin may be slidably engaged with the one or more probes and include a first end configured for insertion into the aperture in the component such that the one or more probes are configured to contact a second surface of the component. The pin may be configured to move between a first position and a second position. An axis of the pin may be substantially aligned with an axis of the tip. The measurement device may be coupled to the tip and configured to measure a value indicating a grip length.