This inventor holds 1 USPTO granted patent. Top assignee: Nearfield Instruments B.v.. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Ruud Ruizenaar: Inventor in Scanning Probe Microscopy
Introduction
Ruud Ruizenaar is an inventor based in Berkel en Rodenrijs, the Netherlands. His patent work includes a system and method for operating scanning probe microscopy equipment.
Latest Patents
Ruizenaar is associated with 1 patent: “Scanning Probe Microscopy System and Method of Operating Such a System.” The invention describes a microscopy system with a sample support structure, a sensor head and probe, a deflection sensor unit, and actuators for Z-motion and scanning. Its control unit processes deflection signals through multiple signal-processing units. A triggering unit compares processed signals with predefined conditions and generates a trigger when a condition is met.
Career Highlights
Ruizenaar works at Nearfield Instruments B.V. His patent reflects work on control and signal-processing methods for scanning probe microscopy systems.
Collaborations
His named coworkers include Hamed Sadeghian Marnani and Arseniy Kalinin.
Conclusion
Ruud Ruizenaar’s patent contribution focuses on signal processing and control in scanning probe microscopy, alongside his work at Nearfield Instruments B.V.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile