Titusville, NJ, United States of America

Russell Todd Granzow

This inventor holds 1 USPTO granted patent. Top assignee: Sarnoff Corporation. Active years: 2002.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Russell Todd Granzow. Retrieved from https://idiyas.com/inventor/russell-todd-granzow

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 10.0

ph-index = 1

Forward Citations = 25(Granted Patents)


Company Filing History:


Years Active: 2002

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Russell Todd Granzow: Innovator in Thermal Assays

Introduction

Russell Todd Granzow is a notable inventor based in Titusville, NJ (US). He has made significant contributions to the field of thermal assays, showcasing his innovative spirit through his patented inventions.

Latest Patents

Granzow holds a patent for "Arrayable thermal assays." This invention provides devices and methods for performing thermal signature assays on two or more samples in an array. The method involves performing heat transfer to the samples using active/control base thermopiles, determining the total heat transferred, and sensing real-time temperature differences between samples.

Career Highlights

Granzow is associated with Sarnoff Corporation, where he applies his expertise in thermal assays. His work has contributed to advancements in the field, enhancing the efficiency and accuracy of thermal testing methods.

Collaborations

Some of his notable coworkers include David Norman Ludington and Thomas Louis Fare. Their collaboration has likely fostered an environment of innovation and creativity within their projects.

Conclusion

Russell Todd Granzow's contributions to thermal assay technology exemplify his dedication to innovation. His patent and work at Sarnoff Corporation highlight his role as a key figure in advancing this important field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…