The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2002
Filed:
Nov. 02, 1999
David Norman Ludington, Newton, PA (US);
Thomas Louis Fare, Redmond, WA (US);
Dominic Joseph Lo Iacono, Yardville, NJ (US);
Timothy James Davis, Columbus, NJ (US);
Helen Jiang Semus, Bensalem, PA (US);
Paul John Stabile, Langhorne, PA (US);
Frank Guarnieri, Brooklyn, NY (US);
Russell Todd Granzow, Titusville, NJ (US);
Peter J. Zanzucchi, Lawrenceville, NJ (US);
William Chiang, Monmouth Jct., NJ (US);
Sarnoff Corporation, Princeton, NJ (US);
Abstract
Provided are, among other things, devices for and methods for performing thermal signature assays on a two or more samples in an array, using active/control base thermopiles, the method comprising: [a] performing a heat transfer to the two or more samples in each of a two or more containers, using at least one base thermopile in thermal communication with the two or more containers; and [b] determining a total heat transferred to the samples by the base thermopile in step [a]; and [c] sensing in real time a temperature difference between a first sample and a second sample of the two or more samples resulting from performing step [a].