Ruiqing Sun

Title: Innovations of Ruiqing Sun in Scan-Based Test Design

Introduction

Ruiqing Sun is a notable inventor based in Shanghai, China. He has made significant contributions to the field of testing operations in electronic devices. His innovative approach has led to the development of a unique patent that enhances the efficiency of testing methodologies.

Latest Patents

Ruiqing Sun holds a patent titled "Scan Based Test Design in Serdes Applications." This patent describes a method for testing the operation of a device under test (DUT). The method involves receiving an input bit stream at an input pin, which includes multiplexed test patterns for multiple scan chains of the DUT. It further details the process of demultiplexing these test patterns and providing corresponding test pattern data to each scan chain. The method culminates in scanning test results from each scan chain to produce multiplex output test data into an output bit stream. This innovative approach streamlines the testing process and improves accuracy.

Career Highlights

Ruiqing Sun is currently employed at Credo Technology Group Limited, where he applies his expertise in electronic testing. His work has been instrumental in advancing the company's technological capabilities. With a focus on innovation, he continues to contribute to the development of cutting-edge solutions in the industry.

Collaborations

Ruiqing collaborates with talented individuals such as Haoli Qian and Yifei Dai. Their combined efforts foster a creative environment that drives innovation and enhances project outcomes.

Conclusion

Ruiqing Sun's contributions to scan-based test design exemplify the impact of innovative thinking in technology. His patent and work at Credo Technology Group Limited highlight his commitment to advancing electronic testing methodologies.