The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 07, 2021

Filed:

Jun. 29, 2018
Applicant:

Credo Technology Group Limited, Grand Cayman, KY;

Inventors:

Haoli Qian, Fremont, CA (US);

Yifei Dai, Shanghai, CN;

Ruiqing Sun, Shanghai, CN;

Assignee:

Credo Technology Group Ltd, Grand Cayman, KY;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3185 (2006.01);
U.S. Cl.
CPC ...
G01R 31/318563 (2013.01); G01R 31/318544 (2013.01); G01R 31/318572 (2013.01);
Abstract

A method for testing operation of a device under test (DUT) includes receiving an input bit stream at an input pin, the input bit stream including multiplexed test patterns for a plurality of scan chains of the DUT. The method further includes demultiplexing the multiplexed test patterns, and providing a corresponding test pattern data to each of the plurality of scan chains. The method further includes, at each of the plurality of scan chains, scanning test results from the scan chain, to produce multiplex output test data into an output bit stream.


Find Patent Forward Citations

Loading…