Ruediger Bormann

Title: Ruediger Bormann: Innovator in X-ray Analysis Technology

Introduction

Ruediger Bormann is a notable inventor based in Rosengarten, Germany. He has made significant contributions to the field of X-ray analysis technology. His innovative work has led to the development of advanced apparatuses that enhance the capabilities of X-ray analysis.

Latest Patents

Ruediger Bormann holds a patent for an X-ray analysis apparatus featuring a graded multilayer mirror. This apparatus is characterized by a curved paraboloid-shaped graded multilayer Bragg reflector. The design allows for the layers of the reflector to be directly introduced onto a concave curved surface of a paraboloid-shaped hollow substrate. The maximum allowable shape deviation for the concave substrate surface facing the reflector is defined by a specific mathematical formula, ensuring precision in its application.

Career Highlights

Bormann is associated with Bruker AXS Analytical X-ray Systems GmbH, a company known for its expertise in analytical X-ray systems. His work at this company has been instrumental in advancing X-ray technology and its applications in various scientific fields.

Collaborations

Throughout his career, Ruediger Bormann has collaborated with esteemed colleagues such as Manfred Schuster and Herbert Goebel. These collaborations have fostered innovation and contributed to the development of cutting-edge technologies in X-ray analysis.

Conclusion

Ruediger Bormann's contributions to X-ray analysis technology exemplify the impact of innovative thinking in scientific research. His patent and work at Bruker AXS Analytical X-ray Systems GmbH highlight his role as a key figure in advancing this important field.