The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 01, 2001
Filed:
Jul. 19, 1999
Applicant:
Inventors:
Manfred Schuster, Munich, DE;
Herbert Goebel, Munich, DE;
Carsten Michaelsen, Geesthacht, DE;
Ruediger Bormann, Rosengarten, DE;
Assignee:
Bruker AXS Analytical X-Ray Systems GmbH, Karlsruhe, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/3207 ; G01N 2/3223 ;
U.S. Cl.
CPC ...
G01N 2/3207 ; G01N 2/3223 ;
Abstract
An X-ray analysis apparatus having a curved paraboloid-shaped curved graded multilayer Bragg reflector (,) is characterized in that the layers of the reflector (,) are directly introduced onto a concave curved surface of a paraboloid-shaped hollow substrate and a maximum allowable shape deviation for the concave substrate surface facing the reflector is &Dgr;p={square root over (2px)} &Dgr;&thgr;,, and having a maximum allowable waviness