Kulsheim, Germany

Rudolf Geier

This inventor holds 1 USPTO granted patent. Top assignee: Atg Test Systems Gmbh. Active years: 1998.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Rudolf Geier. Retrieved from https://idiyas.com/inventor/rudolf-geier-77h79u18

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 1998

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1 patent (USPTO):Explore Patents

Title: Rudolf Geier: Innovator in Test Piece Handling Technology

Introduction

Rudolf Geier is a notable inventor based in Kulsheim-Hundheim, Germany. He has made significant contributions to the field of automated handling systems, particularly in the context of test pieces. His innovative approach has led to the development of a unique method and apparatus that enhances efficiency in testing environments.

Latest Patents

Rudolf Geier holds a patent for a "Method of and apparatus for automatic handling of test pieces." This invention involves a sophisticated system where a stack of test pieces is formed on a lift table. The apparatus utilizes a slide to position the test pieces accurately against a guide bead. The test pieces are then lifted off the stack and transported to a designated test position by a first transporter equipped with replaceable, test piece-specific holding and positioning elements. Following the testing phase, a second transporter, also featuring replaceable holding elements, moves the test pieces to a storage position. This innovative method streamlines the handling process, making it more efficient and reliable.

Career Highlights

Rudolf Geier is currently associated with Atg Test Systems GmbH, a company that specializes in testing technology. His work at Atg Test Systems GmbH has allowed him to apply his inventive skills in a practical setting, contributing to advancements in automated testing solutions. His dedication to innovation is evident in his patent and the impact it has on the industry.

Collaborations

Rudolf Geier collaborates with Christian Happ, a coworker at Atg Test Systems GmbH. Together, they work on enhancing the capabilities of testing systems, focusing on improving efficiency and accuracy in handling test pieces.

Conclusion

Rudolf Geier's contributions to the field of automated handling systems for test pieces demonstrate his commitment to innovation and efficiency. His patent reflects a significant advancement in testing technology, showcasing his expertise and dedication to improving industrial processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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