The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 1998
Filed:
Apr. 15, 1996
Applicant:
Inventors:
Christian Happ, Mondfeld, DE;
Rudolf Geier, Kulsheim-Hundheim, DE;
Assignee:
atg test systems GmbH, Wertheim, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B65G / ;
U.S. Cl.
CPC ...
414797 ; 4147887 ; 4147957 ; 4147966 ; 414908 ;
Abstract
The present invention relates to a method of and an apparatus for handling test pieces in which a stack of test pieces is formed on a lift table of the apparatus and are brought into a predetermined position by a slide, which displaces the test pieces horizontally against a guide bead, with the test pieces being lifted-off the stack and transported to a test position by a first transporter having replaceable test piece-specific holding and positioning elements, and with the test pieces being transported from the test position to a storing position by a second transported having replaceable test piece-specific holding elements.