This inventor holds 1 USPTO granted patent. Top assignee: Varian Associates, Inc.. Active years: 1997.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1997
Title: Roy F Parsons: Innovator in Leak Testing Technology
Introduction
Roy F Parsons was a notable inventor known for his contributions to leak testing technology. He was based in Dunstable, MA (US) and held a patent that significantly advanced the field of hermetically sealed parts testing. His work has had a lasting impact on the industry, particularly in the use of helium spectrometers for leak detection.
Latest Patents
Parsons was awarded a patent for a "Sealed parts leak testing method and apparatus for helium spectrometer." This innovative method involves testing small, hermetically sealed pans after exposing them to a trace gas environment, such as helium. The process is designed to identify both gross and fine leaks in the pans, ensuring their integrity. The non-helium expansion technique, used alongside a helium mass spectrometer leak detector, allows for reliable testing by a single apparatus. The test pan is placed in a sealed fixture, and the pressure in an expansion chamber is measured to determine if there are any leaks.
Career Highlights
Throughout his career, Roy F Parsons worked at Varian Associates, Inc., where he developed his patented leak testing technology. His innovative approach to leak detection has been instrumental in various applications, enhancing the reliability of hermetically sealed devices.
Collaborations
Parsons collaborated with notable coworkers, including David G Mahoney and Glenn E Ruiz, who contributed to the development and refinement of his testing methods.
Conclusion
Roy F Parsons made significant contributions to the field of leak testing technology, particularly through his patented methods for helium spectrometers. His work continues to influence the industry and underscores the importance of innovation in ensuring the integrity of sealed devices.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
